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Xps peak area to atom percentage
Xps peak area to atom percentage









xps peak area to atom percentage

To have an additional control on the procedure, the experiment was repeated on a thick GO film deposited on a Au substrate.

xps peak area to atom percentage

The obtained C/O ratios confirm the occurred GO reduction. X-ray photoelectron spectroscopy is a powerful technique for the chemical analysis of the surface of materials. The collected XPS survey spectra, together with their peak area percentages and C/O ratios, are reported in figures S1S8. This webinar covers the basics of X-ray photoelectron spectroscopy, with a special emphasis on how it can be used in the field of polymer surface analysis. We present how a dual mode ion source can be used for multi-technique sample analysis, showing the importance of sample cleaning and how depth profiles can be performed. Multi-technique Surface Analysis and Cluster Ion Sample Cleaning XPS delivers chemical state information from the topmost nanometers of a sample surface, enabling you to measure passivation coatings, understand catalyst chemistries, and develop bio-compatibility coatings.

xps peak area to atom percentage

This webinar is designed to offer training to current users of Avantage software and act as an introduction to those unfamiliar with it.Įxplore a number of applications for thin film coating analysis including forensic studies, graphene, multi-layered glass, coated fabrics and photovoltaics. Understanding Surface Chemistry with Avantage Software Understanding XPS images and depth profiles with Avantage Software - Part 2īy watching the webinar, you will learn how to use the right tools to understand multi-level data sets, such as depth profiles and images.











Xps peak area to atom percentage